Asymmetric Field Match Line - Plots, Measures Overlap

Advanced Analysis

Asymmetric Field / Match Line

	3D CR Flatness & Uniformity Correction - New
	Statistical & Trend Analysis - New
	Automated 21 Point Film Processor Correction - US Patent 6528803, EU Patent 1252550, JP Patent 3817176
	Image Information Tool
	Star Shot Analysis
	Radiation/Light Field Coincidence (TG40)
	Asymmetric Field/Match Line
	Isodose Contours
	Depth Dose Profiles
	Cross Sections
	Scanner Spatial Calibration - Now in 2D
	Electron Energy Analysis (TG25)
	Sensitometry
	3D Dose Profiles
	Quick Flatness and Symmetry
	Measurement Tool
	Monitor Calibration With TG18 and SMPTE
	IGRT Analysis
	Assure Tests
	Compare Calibration Curves

This routine, which is critical for head and neck treatments, plots and measures the overlap or undershoot associated with independent collimators and calculates the width of the region.


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