Advanced Analysis
 
Measurement Tool
3D CR Flatness & Uniformity Correction - New
Statistical & Trend Analysis - New
Automated 21 Point Film Processor Correction -
US Patent 6528803, EU Patent 1252550,
JP Patent 3817176
Image Information Tool
Star Shot Analysis
Radiation/Light Field Coincidence (TG40)
Asymmetric Field/Match Line
Isodose Contours
Depth Dose Profiles
Cross Sections
Scanner Spatial Calibration - Now in 2D
Electron Energy Analysis (TG25)
Sensitometry
3D Dose Profiles
Quick Flatness and Symmetry
Measurement Tool
Monitor Calibration With TG18 and SMPTE
IGRT Analysis
Assure Tests
Compare Calibration Curves

Now you may interactively perform measurements on any image or plot including graphical and statistical analysis with direct viewing of original data values.

By right clicking on the measurement tool, a profile can be generated through any image or image type plot (isodose, subtraction, gamma, DTA) at any angle. The ASCII data of this profile can be exported.




© Radiological Imaging Technology - 2008
Protected by US Patents 6528803, 6675116, 6934358, 6934653, 6937751, 7013228, 7016464, 7024026, 7233688, 7327902,
EP Patents 1252550, 1318857, 7024026, JP Patent 3817176 and other pending US and foreign patents - Learn more...
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