Advanced Analysis
 
Quick Flatness and Symmetry
3D CR Flatness & Uniformity Correction - New
Statistical & Trend Analysis - New
Automated 21 Point Film Processor Correction -
US Patent 6528803, EU Patent 1252550,
JP Patent 3817176
Image Information Tool
Star Shot Analysis
Radiation/Light Field Coincidence (TG40)
Asymmetric Field/Match Line
Isodose Contours
Depth Dose Profiles
Cross Sections
Scanner Spatial Calibration - Now in 2D
Electron Energy Analysis (TG25)
Sensitometry
3D Dose Profiles
Quick Flatness and Symmetry
Measurement Tool
Monitor Calibration With TG18 and SMPTE
IGRT Analysis
Assure Tests
Compare Calibration Curves

One routine to do Horizontal and Vertical Profiles, and Isodose Analysis all on one page.




© Radiological Imaging Technology - 2009
Protected by US Patents 6528803, 6675116, 6934358, 6934653, 6937751, 7013228, 7016464, 7024026, 7233688, 7327902,
EP Patents 1252550, 1318857, 7024026, JP Patent 3817176 and other pending US and foreign patents - Learn more...
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